Paper Title :Implementation of Effective Integrated on-Chip ESD Protection in Nanoscale CMOS Regime for RFIC
Author :P. N. Khairnar, N. K.Khairnar
Article Citation :P. N. Khairnar ,N. K.Khairnar ,
(2018 ) " Implementation of Effective Integrated on-Chip ESD Protection in Nanoscale CMOS Regime for RFIC " ,
International Journal of Electrical, Electronics and Data Communication (IJEEDC) ,
pp. 39-43,
Volume-6,Issue-6
Abstract : Now-a-days scaling of technology has gain lot of importance because of its various advantages. Many digital &
analog IC’s are made compact in size using a scaling technology with improved throughput. However with the added
advantages there are some disadvantages of this technique, such as leakage current, power dissipation in the form of heat at
higher frequencies ESD (Electrostatic Discharge) etc. These disadvantages incorporate the some critical design challenges in
RFIC. Among them, in this work we are primarily focus on ESD effect. ESD is happens at higher frequency frequently. It is
a main challenge in RFIC design; the survey shows that in all over the world about 70% IC’s were failed due to the ESD
event and remaining 30% were because of other factors. We are trying to suggest a methodology to reduce the ESD effect
for proper operation of RFIC. The circuitry used for the implementation is on chip integrated technique which differsfrom
the conventional technologies. A LVTSCR (Low Voltage Triggered Silicon Controlled Rectifier) is used as protectoral
architecture. Here LNA (Low Noise Amplifier) is used as an exemplary RFIC core circuit. By using LVTSCR we try to
protect it from ESD event.In this research paper we have select operating frequency 5 GHz to 6 GHz. The 130 nm CMOS
technology is selected for circuit implementation. LVTSCR is providing good solution for on chip protection of ESD for
various digital & analog IC’s. Simulation tool used for design & simulating the design of core circuit (without protection) &
RF+ESD circuit (With protection circuit) is Agilent’s Advanced Design System software (ADS). It is very good tool
compare to other conventional simulator. After simulation it is observed that there is slightly degrade in gain, noise figure,
I/O matching, IIP3 etc. in case of with protection circuit.
Keywords - ESD Protection, LVTSCR (Low voltage triggered silicon controlled rectifier), LNA (Low Noise Amplifier),
nanoscale etc.
Type : Research paper
Published : Volume-6,Issue-6
Copyright: © Institute of Research and Journals
|
 |
| |
 |
PDF |
| |
Viewed - 56 |
| |
Published on 2018-08-14 |
|