Paper Title :Design Of An Automated Reflection Ellipsometry Setup For Determining Complex Permittivity Of Materials In Microwave Band

Author :Ashok Kumar A, Surya Prakash P, Ragavendra M S, Raakeshcharan A, Santosh Aditya S, Jayakumar M

Article Citation :Ashok Kumar A ,Surya Prakash P ,Ragavendra M S ,Raakeshcharan A ,Santosh Aditya S ,Jayakumar M , (2014 ) " Design Of An Automated Reflection Ellipsometry Setup For Determining Complex Permittivity Of Materials In Microwave Band " , International Journal of Electrical, Electronics and Data Communication (IJEEDC) , pp. 41-44, Volume-2,Issue-7

Abstract : This paper deals with an automated setup dedicated for characterization of dielectric properties of materials at microwave frequencies based on the reflection Ellipsometry technique. This instrumentation presents itself as an alternate and inexpensive choice to a vector network analyser. The complex permittivity of a soda lime glass sheet was measured. Interfaces involved in the automation of the Ellipsometry setup are briefly discussed. The numerical approach for determining the complex permittivity is also discussed.

Type : Research paper

Published : Volume-2,Issue-7

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