International Journal of Electrical, Electronics and Data Communication (IJEEDC)
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Statistics report
Feb. 2020
Submitted Papers : 80
Accepted Papers : 10
Rejected Papers : 70
Acc. Perc : 12%
Issue Published : 84
Paper Published : 1397
No. of Authors : 3784
  Journal Paper

Paper Title
Testing of Stuck at Fault in Digital Circuits at Register Transfer Logic (RTL)

Abstract
Semiconductor Integrated Circuits (ICs) can have millions of digital circuits which can translate to billions of transistors. Lots of effort has been put into Electronic Design Automation (EDA) systems and Design for Test (DFT) techniques to manage the development and application of digital circuit testing. In the beginning these software programs and DFT techniques used the Stuck at Fault Model.With a stuck at fault model we are applying a structural test approach. Instead of testing all combination of 1’s and 0’s to a VLSI device, we will test with a reduced set of test vectors. Stuck at Fault Models operate at the logic model of digital circuits. We will detect the stuck-at fault using the concept of textio. Keywords - Stuck-atfaults; Fault coverage; Testpoints; Validation Sets; Textio


Author - Naina A. Udge, S. A. Ladhake, P. D. Gawande

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| Published on 2018-09-03
   
   
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