Paper Title :Measurement on Magnetic Characteristics of Semiconductor Material (GAN) By FDTD Technique

Author :Phyoe Sandar Win, Hla Myo Tun, Zaw Min Naing, Win Khaing Moe

Article Citation :Phyoe Sandar Win ,Hla Myo Tun ,Zaw Min Naing ,Win Khaing Moe , (2018 ) " Measurement on Magnetic Characteristics of Semiconductor Material (GAN) By FDTD Technique " , International Journal of Electrical, Electronics and Data Communication (IJEEDC) , pp. 15-18, Volume-6,Issue-4

Abstract : The paper presents the measurement on magnetic characteristics which are affected on the luminescence properties of semiconductor materials for optoelectronic device fabrication using Finite Difference Time Domain (FDTD) technique. The FDTD technique is a powerful tool for performance analysis by using MATLAB simulations. The performance of the magnetic characteristics for semiconductor material could be evaluated based on the outcomes from the simulation results. The verification for simulation results has been carried out based on the experimental results from the laboratory. Index terms - Measurement Technique, Magnetic Characteristics, Semiconductor Material, Optoelectronic Devices, MATLAB, FDTD Technique.

Type : Research paper

Published : Volume-6,Issue-4

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